Defect and Fault Tolerance in VLSI Systems, 1991 Workshop
| Author/creator | Institute of Electrical and Electronics Engineers, Inc. Staff |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Los Alamitos : IEEE Computer Society Press |
| Description | 312 p. |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Subjects |
| Summary | Annotation The workshop, held November 1991, Hidden Valley, Pennsylvania, covered the latest developments in the field, including reports from several defect and fault tolerance implementation projects reaching fruition. Among the topics: architecture, repair and restructuring techniques, online reconfiguration, packaging techniques, defect and fault models, yield models, test methods, and CAD tools. No subject index. Annotation copyrighted by Book News, Inc., Portland, OR |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 91073938 |
| ISBN | 9780818624575 |
| ISBN | 0818624574 (Trade Cloth) Out of Stock Indefinitely |
| Standard identifier# | 9780818624575 |
| Stock number | 00029433 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |