Defect and Fault-Tolerance in VLSI Systems, 1996 Workshop On
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Los Alamitos : IEEE Computer Society Press |
| Description | 300 p. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive |
| Subjects |
| Summary | Annotation The 39 papers cover avoiding defects, predicting yield, enhancing yield and reliability, layout-driven tests, analyzing process data, tests and diagnosis, designing self-tests and self- checking, fault-tolerant structures, synthesizing reliable circuits, and approaches to fault-tolerance. The gathering was the latest in an annual series that began in 1988 and has become recognized as the major international forum for researchers and practitioners to discuss defect and fault tolerance at the integrated circuit level. No subject index. Annotation copyrighted by Book News, Inc., Portland, OR |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 10636722 |
| ISBN | 9780818675454 |
| ISBN | 0818675454 (Trade Cloth) Active Record |
| Standard identifier# | 9780818675454 |
| Stock number | 00029433 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |