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010 a| 93080010;

020 a| 0780314301 (casebound);

020 a| 0780314298 (softbound);

020 a| 078031431X (microfiche);

035 a| (WaSeSS)ssj0000450945;

040 a| DLCc| DLCd| DLCd| WaSeSS;

049 a| EREEa| NEHH;

050 00 a| TK7874b| .I474 1993;

082 00 a| 621.3815/028/72| 20;

111 2 a| International Test Conferenced| (1993 :c| Baltimore, Md.)?| UNAUTHORIZED;

245 10 a| Designing, testing, and diagnostics--join themh| [electronic resource] :b| International Test Conference 1993 proceedings :October 17-21, 1993, Convention Center, Baltimore, Maryland, USA /c| sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section.;

260 a| Altoona, PA :b| The Conference ;a| Piscataway, NJ :b| Can be ordered from IEEE Service Center,;

300 a| xii, 1065 p. :b| ill. ;c| 29 cm.;

500 a| Cover title.;

500 a| "IEEE catalog number 93CH3356-3"--P. ii.;

500 a| "IEEE Computer Society Press order number 4192-02"--P. ii.;

504 a| Includes bibliographical references and index.;

506 a| Available only to authorized users.;

538 a| Mode of access: World Wide Web;

650 00 a| Integrated circuitsx| Testingv| Congresses.=| ^A598122;

650 00 a| Automatic test equipmentv| Congresses.=| ^A653928;

655 0 a| Electronic books.=| ^A491897;

710 2 a| IEEE Computer Society.b| Test Technology Technical Committee.=| ^A724761;

710 2 a| Institute of Electrical and Electronics Engineers.b| Philadelphia Section.=| ^A724775;

710 2 a| IEEE Xplore (Online service)=| ^A534875;

856 40 z| Full text available from IEEE Electronic Library (IEL) Conference Proceedingsu| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D3304;

856 40 z| Full text available from IEEE Conference Proceedings Archiveu| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D3304;

856 40 z| Full text available from IEEE Electronic Library (IEL)u| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D3304;

949 a| CLICK ON WEB ADDRESSw| ASISh| JOYNER188;

949 a| CLICK ON WEB ADDRESSw| ASISh| HSL77;

949 a| CLICK ON WEB ADDRESSw| ASISh| JMUSIC60;

596 a| 1 3 4;

998 a| 4669618;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4669618-1001l| JNETm| JOYNERr| Ys| Yt| JNESSBKu| 3/20/2017x| EBOOKz| JERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4669618-2001l| HSLELECm| HSLr| Ys| Yt| HEBKu| 3/20/2017x| EBOOKz| HERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4669618-3001l| MNETm| JMUSICr| Ys| Yt| MNESSBKu| 3/20/2017x| EBOOKz| JERESOURCE;

Designing, testing, and diagnostics--join them International Test Conference 1993 proceedings :October 17-21, 1993, Convention Center, Baltimore, Maryland, USA / sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section.

Author/creator	International Test Conference
Other author	IEEE Computer Society. Test Technology Technical Committee.
Other author	Institute of Electrical and Electronics Engineers. Philadelphia Section.
Other author	IEEE Xplore (Online service)
Format	Electronic
Publication Info	Altoona, PA : The Conference ; Piscataway, NJ : Can be ordered from IEEE Service Center,
Description	xii, 1065 p. : ill. ; 29 cm.
Supplemental Content	Full text available from IEEE Electronic Library (IEL) Conference Proceedings
Supplemental Content	Full text available from IEEE Conference Proceedings Archive
Supplemental Content	Full text available from IEEE Electronic Library (IEL)
Subjects	Integrated circuits--Testing. --Congresses. Automatic test equipment--Congresses.

General note	Cover title.
General note	"IEEE catalog number 93CH3356-3"--P. ii.
General note	"IEEE Computer Society Press order number 4192-02"--P. ii.
Bibliography note	Includes bibliographical references and index.
Access restriction	Available only to authorized users.
Technical details	Mode of access: World Wide Web
Genre/form	Electronic books.
LCCN	93080010
ISBN	0780314301 (casebound)
ISBN	0780314298 (softbound)
ISBN	078031431X (microfiche)

Availability

Library	Location	Call Number	Status	Item Actions
	Electronic Resources	Online Content Full text available from IEEE Electronic Library (IEL) Conference Proceedings Full text available from IEEE Electronic Library (IEL) Conference Proceedings Full text available from IEEE Electronic Library (IEL) Conference Proceedings	✔ Available

Designing, testing, and diagnostics--join them International Test Conference 1993 proceedings :October 17-21, 1993, Convention Center, Baltimore, Maryland, USA / sponsored by IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section.

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