Fourth International Symposium on Quality Electronic Design proceedings : 24-26 March, 2003, San Jose, California / sponsored by, IEEE Electron Device [sic] Society (EDS) ... [et al.].

Author/creator International Symposium on Quality Electronic Design
Other author IEEE Electron Devices Society.
Other author IEEE Xplore (Online service)
Format Electronic
Publication InfoLos Alamitos, Calif. : IEEE Computer Society,
Descriptionxxi, 457 p. : ill. ; 28 cm.
Supplemental ContentFull text available from IEEE Electronic Library (IEL) Conference Proceedings
Supplemental ContentFull text available from IEEE Electronic Library (IEL)
Subjects
Integrated circuits--Very large scale integration. --Reliability. --Congresses.
Integrated circuits--Very large scale integration. --Design and construction. --Congresses.
Integrated circuits--Very large scale integration. --Computer-aided design. --Congresses.
Integrated circuits--Very large scale integration. --Testing. --Quality control. --Congresses.

Added title page ISQED 2003
Portion of title Quality electronic design
Cover title Proceedings of the ISQED 2003
Spine title ISQED proceedings 2003
General note"IEEE Computer Society Order Number PR01881"--T.p. verso.
Bibliography noteIncludes bibliographical references and author index.
Access restrictionAvailable only to authorized users.
Other formsAlso available via the World Wide Web.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 2002116028
ISBN0769518818 (pbk.)

Availability

Library Location Call Number Status Item Actions
Electronic Resources ✔ Available