IEEE International Conference on Wafer Scale Integration, 1994
| Author/creator | IEEE, Components, Hybrids and Manufacturing Technology |
| Other author | IEEE, Institute of Electrical and Electronics Engineers, Inc. Staff. |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Piscataway : IEEE |
| Description | 400 p. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Subjects |
| Summary | Annotation Proceedings of the Sixth Annual IEEE International Conference on Wafer Scale Integration, Held in San Francisco, January 1994. Sessions cover applications, yield assessment, reconfiguration, testability, and physical issues. The keynote address by Steven D. Millman, "WSI Evolution: Increasing Cell Size to Generalize Design," addresses the ability to use increased cell size as the VLSI technologies advance. Annotation copyright by Book News, Inc., Portland, OR |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| ISBN | 9780780318502 |
| ISBN | 0780318501 (Library Binding) Active Record |
| Standard identifier# | 9780780318502 |
| Stock number | 94CH3412-4 00013077 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |