International Symposium on Quality Electronic Design 18-21 March, 2002, San Jose, California : proceedings / technical sponsorship provided by IEEE Technical Committee on VLSI Design (TCVLSI) ... [et al.].

Author/creator International Symposium on Quality Electronic Design
Other author IEEE Computer Society. Technical Committee on VLSI.
Other author IEEE Xplore (Online service)
Format Electronic
Publication InfoLos Alamitos, Calif. : IEEE Computer Society,
Descriptionxxii, 549 p. : ill. ; 28 cm.
Supplemental ContentFull text available from IEEE Electronic Library (IEL) Conference Proceedings
Supplemental ContentFull text available from IEEE Electronic Library (IEL)
Subjects
Integrated circuits--Very large scale integration. --Reliability. --Congresses.
Integrated circuits--Very large scale integration. --Design and construction. --Congresses.
Integrated circuits--Very large scale integration. --Computer-aided design. --Congresses.
Integrated circuits--Very large scale integration. --Testing. --Quality control. --Congresses.

Portion of title Quality electronic design
Cover title 2002 3rd International Symposium on Quality Electronic Design
Cover title Proceedings of the ISQED 2002
General note"IEEE Computer Society Order Number PR01561"--T.p. verso.
Bibliography noteIncludes bibliographical references and author index.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 2002101055
ISBN0769515614
ISBN0769515622 (case)
ISBN0769515630 (microfiche)