Records / of the 1999 IEEE International Workshop on Memory Technology, Design and Testing, August 9-10, 1999, San Jose, Calif., USA ; edited by R. Rajsuman and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Committee on VLSI, IEEE Computer Society Technical Council on Test Technology ; in cooperation with the IEEE Solid-State Circuits Society.
| Author/creator | IEEE International Workshop on Memory Technology, Design and Testing |
| Format | Electronic |
| Publication Info | Los Alamitos, Calif. : IEEE Computer Society, |
| Description | ix, 131 p. : ill. ; 28 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Subjects |
| Other author/creator | Rajsuman, Rochit. |
| Other author/creator | Wik, T. (Thomas) |
| Other author/creator | IEEE Computer Society. |
| Other author/creator | IEEE Computer Society. Technical Committee on VLSI. |
| Other author/creator | IEEE Computer Society. Technical Council on Test Technology. |
| Other author/creator | IEEE Solid-State Circuits Society. |
| Other author/creator | IEEE Xplore (Online service) |
| General note | "IEEE Computer Society Order Number PR00259"--T.p. verso. |
| Bibliography note | Includes bibliographical references and index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 00501668 |
| ISBN | 0769502598 |
| ISBN | 076950261X (microfiche) |
| ISSN | 1087-4852 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |