MTDT 2004 records of the 2004 International Workshop on Memory Technology, Design and Testing : 9-10 August, 2004, San Jose, California, USA / edited by R. Rajsuman and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Test Technology Technical Council, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society.
| Author/creator | IEEE International Workshop on Memory Technology, Design and Testing |
| Format | Electronic |
| Publication Info | Los Alamitos, Calif. : IEEE Computer Society, |
| Description | vii, 121 p. : ill. ; 27 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Subjects |
| Other author/creator | Rajsuman, Rochit. |
| Other author/creator | Wik, T. (Thomas) |
| Other author/creator | IEEE Computer Society. |
| Other author/creator | IEEE Computer Society. Technical Committee on VLSI. |
| Other author/creator | IEEE Computer Society. Technical Council on Test Technology. |
| Other author/creator | IEEE Solid-State Circuits Society. |
| Other author/creator | IEEE Xplore (Online service) |
| Portion of title | Memory technology, design and testing |
| Cover title | Records of the 2004 IEEE International Workshop on Memory Technology, Design and Testing |
| General note | "IEEE Computer Society Order Number P2193"--T.p. verso. |
| General note | Workshop number from Web site. |
| Bibliography note | Includes bibliographical references and author index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2005295655 |
| ISBN | 0769521932 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |