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037 b| IEEE Computer Society, Customer Service Center, 10662 Los Vaqueros Circle, P.O. Box 3014, Los Alamitos, CA 90720-1314;

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111 2 a| IEEE International Workshop on Memory Technology, Design and Testingn| (8th :d| 2000 :c| San Jose, Calif.)?| UNAUTHORIZED;

245 10 a| Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testingh| [electronic resource] :b| August 7-8, 2000, San Jose, California /c| edited by R. Rajsuman and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society.;

246 18 a| Records of the IEEE International Workshop on Memory Technology, Design and Testing 2000;

260 a| Los Alamitos, Calif. :b| IEEE Computer Society,;

300 a| x, 131 p. :b| ill. ;c| 28 cm.;

500 a| "IEEE Computer Society Order Number PR00689"--T.p. verso.;

500 a| "This is the 8th year of this exciting event"--P. viii.;

504 a| Includes bibliographical references and author index.;

506 a| Available only to authorized users.;

530 a| Also available via the World Wide Web with additional title: Memory Technology, Design and Testing, 2000, records of the 2000 IEEE International Workshop on.;

538 a| Mode of access: World Wide Web;

650 0 a| Semiconductor storage devicesx| Testingv| Congresses.=| ^A90527;

650 0 a| Random access memoryv| Congresses.=| ^A429975;

655 0 a| Electronic books.=| ^A491897;

700 1 a| Rajsuman, Rochit.=| ^A819579;

700 1 a| Wik, T.q| (Thomas)?| UNAUTHORIZED;

710 2 a| IEEE Computer Society.=| ^A53823;

710 2 a| IEEE Computer Society.b| Technical Committee on VLSI.=| ^A559676;

710 2 a| IEEE Computer Society.b| Technical Council on Test Technology.=| ^A728178;

710 2 a| IEEE Solid-State Circuits Society.=| ^A729346;

710 2 a| IEEE Xplore (Online service)=| ^A534875;

740 0 a| Memory Technology, Design and Testing, 2000, records of the 2000 IEEE International Workshop on.;

856 40 z| Full text available from IEEE Electronic Library (IEL) Conference Proceedingsu| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D6973;

856 40 z| Full text available from IEEE Electronic Library (IEL)u| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D6973;

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Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing August 7-8, 2000, San Jose, California / edited by R. Rajsuman and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society.

Author/creator	IEEE International Workshop on Memory Technology, Design and Testing
Format	Electronic
Publication Info	Los Alamitos, Calif. : IEEE Computer Society,
Description	x, 131 p. : ill. ; 28 cm.
Supplemental Content	Full text available from IEEE Electronic Library (IEL) Conference Proceedings
Supplemental Content	Full text available from IEEE Electronic Library (IEL)
Subjects	Semiconductor storage devices--Testing. --Congresses. Random access memory--Congresses.

Other author/creator	Rajsuman, Rochit.
Other author/creator	Wik, T. (Thomas)
Other author/creator	IEEE Computer Society.
Other author/creator	IEEE Computer Society. Technical Committee on VLSI.
Other author/creator	IEEE Computer Society. Technical Council on Test Technology.
Other author/creator	IEEE Solid-State Circuits Society.
Other author/creator	IEEE Xplore (Online service)
Spine title	Records of the IEEE International Workshop on Memory Technology, Design and Testing 2000
General note	"IEEE Computer Society Order Number PR00689"--T.p. verso.
General note	"This is the 8th year of this exciting event"--P. viii.
Bibliography note	Includes bibliographical references and author index.
Access restriction	Available only to authorized users.
Other forms	Also available via the World Wide Web with additional title: Memory Technology, Design and Testing, 2000, records of the 2000 IEEE International Workshop on.
Technical details	Mode of access: World Wide Web
Genre/form	Electronic books.
Other title	Memory Technology, Design and Testing, 2000, records of the 2000 IEEE International Workshop on.
LCCN	2001270775
ISBN	0769506895
ISBN	0769506909 (case)
ISBN	0769506917 (microfiche)
Stock number	IEEE Computer Society, Customer Service Center, 10662 Los Vaqueros Circle, P.O. Box 3014, Los Alamitos, CA 90720-1314

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	Electronic Resources	Online Content Full text available from IEEE Electronic Library (IEL) Conference Proceedings Full text available from IEEE Electronic Library (IEL) Conference Proceedings	✔ Available

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