VLSI Test Symposium Proceedings: IEEE VLSI Test Symposium (17th: 1999: Dana Point, CA)
| Author/creator | IEEE Staff |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Los Alamitos : IEEE Computer Society Press |
| Description | 530 p. 28.000 x 022.000 cm. |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Subjects |
| Summary | Annotation The theme of the April 1999 symposium "Scaling deeper to submicron: test technology challenges" reflects the issues being created by the move toward nanometer technologies. Many creative and novel ideas and approaches to the current and future electronic circuit testing-related problems are explored and analyzed in the 62 paper presentations. The paper sessions span key areas in testing, such as BIST, mixed signal test, Iddq test, diagnosis, validation /verification, boundary scan, memory test, delay test and ATPG. Other sessions on emerging areas include defect level test, testing high speed circuits, MEMS test, and high-level test techniques. No subject index. Annotation copyrighted by Book News, Inc., Portland, OR |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| ISBN | 9780769501468 |
| ISBN | 076950146X (Trade Paper) Active Record |
| Standard identifier# | 9780769501468 |
| Stock number | 00029433 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |