Tools

LEADER 02865cam 2200505 a 4500

001 ssj0000443316;

003 WaSeSS;

005 20240512155341.0;

006 m d ;

007 cr n ;

008 900518s1990 caua sb 101 0 eng d;

010 a| 90055486;

020 a| 081869064X;

035 a| (WaSeSS)ssj0000443316;

040 a| DLCc| DLCd| DLCd| WaSeSS;

049 a| EREEa| NEHH;

050 00 a| TK7874b| .I474 1990;

082 00 a| 621.381/52| 20;

111 2 a| International Test Conferencen| (21st :d| 1990 :c| Washington, D.C.)?| UNAUTHORIZED;

245 14 a| The changing philosophy of testh| [electronic resource] :b| International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC /c| sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section.;

260 a| Los Alamitos, Calif. :b| IEEE Computer Society Press,;

300 a| xvi, 1083 p. :b| ill. ;c| 29 cm.;

500 a| "IEEE catalog number 90CH2910-6"--T.p. verso.;

504 a| Includes bibliographical references and index.;

506 a| Available only to authorized users.;

538 a| Mode of access: World Wide Web;

650 0 a| Integrated circuitsx| Testingv| Congresses.=| ^A598122;

650 0 a| Automatic test equipmentv| Congresses.=| ^A653928;

650 0 a| Semiconductorsx| Testingv| Congresses.=| ^A1242422;

655 0 a| Electronic books.=| ^A491897;

710 2 a| IEEE Computer Society.b| Test Technology Technical Committee.=| ^A724761;

710 2 a| IEEE Computer Society.b| Philadelphia Chapter.?| UNAUTHORIZED;

710 2 a| IEEE Xplore (Online service)=| ^A534875;

856 40 z| Full text available from IEEE Electronic Library (IEL) Conference Proceedingsu| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D485;

856 40 z| Full text available from IEEE Conference Proceedings Archiveu| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D485;

856 40 z| Full text available from IEEE Electronic Library (IEL)u| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D485;

949 a| CLICK ON WEB ADDRESSw| ASISh| JOYNER188;

949 a| CLICK ON WEB ADDRESSw| ASISh| HSL77;

949 a| CLICK ON WEB ADDRESSw| ASISh| JMUSIC60;

596 a| 1 3 4;

998 a| 4687950;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4687950-1001l| JNETm| JOYNERr| Ys| Yt| JNESSBKu| 4/14/2017x| EBOOKz| JERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4687950-2001l| HSLELECm| HSLr| Ys| Yt| HEBKu| 4/14/2017x| EBOOKz| HERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 4687950-3001l| MNETm| JMUSICr| Ys| Yt| MNESSBKu| 4/14/2017x| EBOOKz| JERESOURCE;

The changing philosophy of test International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC / sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section.

Author/creator	International Test Conference
Other author	IEEE Computer Society. Test Technology Technical Committee.
Other author	IEEE Computer Society. Philadelphia Chapter.
Other author	IEEE Xplore (Online service)
Format	Electronic
Publication Info	Los Alamitos, Calif. : IEEE Computer Society Press,
Description	xvi, 1083 p. : ill. ; 29 cm.
Supplemental Content	Full text available from IEEE Electronic Library (IEL) Conference Proceedings
Supplemental Content	Full text available from IEEE Conference Proceedings Archive
Supplemental Content	Full text available from IEEE Electronic Library (IEL)
Subjects	Integrated circuits--Testing. --Congresses. Electronic digital computers--Circuits. --Testing. --Congresses. Automatic test equipment--Congresses. Semiconductors--Testing. --Congresses.

General note	"IEEE catalog number 90CH2910-6"--T.p. verso.
Bibliography note	Includes bibliographical references and index.
Access restriction	Available only to authorized users.
Technical details	Mode of access: World Wide Web
Genre/form	Electronic books.
LCCN	90055486
ISBN	081869064X

The changing philosophy of test International Test Conference, 1990 proceedings : September 10-14, 1990, Sheraton Washington Hotel, Washington, DC / sponsored by the IEEE Computer Society Test Technology Technical Committee and IEEE Philadelphia Section.

Click here for more information about this title