Monte Carlo modeling for electron microscopy and microanalysis / David C. Joy.

Author/creator Joy, David C., 1943-
Format Electronic
Publication InfoNew York : Oxford University Press,
Descriptionviii, 216 p. : ill. ; 25 cm.
Supplemental ContentFull text available from Ebook Central - Academic Complete
Subjects

SeriesOxford series in optical and imaging sciences ; 9
Bibliography noteIncludes bibliographical references.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 94035642
ISBN0195088743 (acid-free paper)

Availability

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Electronic Resources Access Content Online ✔ Available