Dielectric and conductor-loss characterization and measurements on electronic packaging materials / James Baker-Jarvis [and others].
| Author/creator | Baker-Jarvis, James |
| Other author | National Institute of Standards and Technology (U.S.) |
| Format | Microform |
| Publication Info | Boulder, Colo. : U.S. Dept. of Commerce, National Institute of Standards and Technology ; Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O., 2001. |
| Description | iv, 152 pages : illustrations ; 28 cm. |
| Subjects |
| Series | NIST technical note ; 1520 NIST technical note 1520. ^A420535 |
| General note | "July 2001." |
| General note | Shipping list no.: 2002-0259-M. |
| General note | CRDP Program record. |
| Bibliography note | Includes bibliographical references (pages 132-150). |
| Reproduction note | Microfiche. [Washington, D.C.] U.S. Govt. Print. Off., [2002]. 2 microfiches : negative. |
| Issued in other form | Online version: Baker-Jarvis, James. Dielectric and conductor-loss characterization and measurements on electronic packaging materials. |
| GPO item number | 0249-A (MF) |
| Govt. docs number | C 13.46:1520 |