Dielectric and conductor-loss characterization and measurements on electronic packaging materials / James. Baker-Jarvis [and five others].
| Author/creator | Baker-Jarvis, James author. |
| Other author | United States. National Bureau of Standards. |
| Other author | National Institute of Standards and Technology (U.S.) issuing body. |
| Format | Electronic |
| Production | Boulder, Colo. : U.S. Department of Commerce, National Institute of Standards and Technology, 2001. |
| Description | 1 online resource (iv, 152 pages) : illustrations. |
| Supplemental Content | https://purl.fdlp.gov/GPO/gpo85912 |
| Subjects |
| Series | NIST technical note ; 1520 NIST technical note 1520. ^A420535 |
| General note | "July 2001." |
| General note | "CODEN: NTNOEF." |
| General note | CRDP Program record. |
| Bibliography note | Includes bibliographical references (pages 132-150). |
| Source of description | Description based on online resource, PDF version; title from title page (NIST, viewed October 24, 2017). |
| Issued in other form | Microform version: Dielectric and conductor-loss characterization and measurements on electronic packaging materials |
| GPO item number | 0249-A (online) |
| Govt. docs number | C 13.46:1520 |