2014 IEEE 23rd North Atlantic Test Workshop (NATW)
| Author/creator | IEEE Staff |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Piscataway : IEEE |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Subjects |
| Summary | Annotation The IEEE North Atlantic Test Workshop provides a forum for discussions on the latest issues relating to high quality, economical, and efficient test methodologies and designs The 22nd NATW will feature a half day tutorial on Wednesday titled VLSI Test and Security The program includes a keynote by Brian Gaucher (IBM) on Smart Power Grids and an invited address by Stephen Sunter (Mentor Graphics) on Analog Mixed signal Test In addition to traditional topics, the 22nd NATW will feature a general theme of Growing importance of Test and Hardware Security Topics are not limited to, the following Analog, Mixed Signal & RF Testing Built In Self Test (BIST) Board Level Testing Delay & Performance Testing Design Verification Validation Diagnosis and Debug Fault Modeling Simulation FPGA & Embedded Core Testing IDDQ Testing DFM, Defect Analysis & Defect Based Testing Memory & MEMS Testing Nanotechnology Testing Online Testing System on Chip (SoC) Test & Debug Test Quality System Reliabi |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| ISBN | 9781479951369 |
| ISBN | 1479951366 (Spiral) Active Record |
| Stock number | 00066573 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |