Electromigration in ULSI Interconnections / Cher Ming Tan.
| Author/creator | Tan, Cher Ming, 1959- |
| Format | Electronic |
| Publication Info | Singapore ; Hackensack, NJ : World Scientific, |
| Description | xix, 291 p. : ill. ; 24 cm. |
| Supplemental Content | Full text available from Ebook Central - Academic Complete |
| Subjects |
| Series | International series on advances in solid state electronics and technology International series on advances in solid state electronics and technology. ^A1152649 |
| Bibliography note | Includes bibliographical references and index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2011280775 |
| ISBN | 9789814273329 |
| ISBN | 9814273325 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | Access Content Online | ✔ Available |