Gettering and defect engineering in semiconductor technology XV selected papers from the 15th Gettering and Defect Engineering in Semiconductor Technology Conference (GADEST 2013), September 22-27, 2013, Oxford, UK / edited by J.D. Murphy.

Other author Murphy, J. D.
Format Electronic
Publication InfoDurnten-Zurich : Trans Tech publications Ltd, [2014]
Descriptionxiv, 516 pages : illustrations (black and white) ; 24 cm.
Supplemental ContentFull text available from Ebook Central - Academic Complete
Subjects

SeriesDiffusion and defect data. Pt. B, Solid state phenomena, 1012-0394 ; volumes 205/206
Diffusion and defect data. Pt. B, Solid state phenomena ; v. 205/206. ^A1003549
Bibliography noteIncludes bibliographical references and index.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Terms of useCurrent copyright fee: GBP18.00 50\0.
Genre/formElectronic books.
LCCN 2016439324
ISBN9783037858240 (paperback)
ISBN3037858249 (paperback)

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