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001 on1112778832;

003 OCoLC;

005 20191025023156.0;

006 m o d ;

007 cr unu||||||||;

008 190823s2019 ncua obm 000 0 eng d;

035 a| (Sirsi) o1112778832;

035 a| (OCoLC)1112778832;

049 a| EREE;

090 a| QD96.X2;

100 1 a| Eisenmann, James William, III,e| author.?| UNAUTHORIZED;

245 10 a| Development of a proton induced x-ray emission (PIXE) material analysis system /c| by James William Eisenmann III.;

264 1 a| [Greenville, N.C.] :b| [East Carolina University],c| 2019.;

300 a| 138 pages :b| illustrations (chiefy color);

336 a| textb| txt2| rdacontent;

337 a| computerb| c2| rdamedia;

338 a| online resourceb| cr2| rdacarrier;

347 a| text fileb| PDFc| 5.648 MB2| rda;

538 a| System requirements: Adobe Reader.;

538 a| Mode of access: World Wide Web.;

502 b| M.S.c| East Carolina Universityd| 2019.;

500 a| Presented to the faculty of the Department of Physics;

500 a| Advisor: Jefferson Shinpaugh;

500 a| Title from PDF t.p. (viewed October 15, 2019).;

520 3 a| A material analysis system using particle-induced x-ray emission (PIXE) analysis has been developed to measure trace element composition in a wide range of samples. The system was constructed in the particle accelerator laboratory in the Department of Physics at East Carolina University, and includes a new high-vacuum beamline on the 2-million-volt tandem Pelletron ion accelerator, which includes a modified multi-sample target chamber. PIXE analysis can provide sensitivities to the parts-per-million level or better for many elements. In this method, a sample is irradiated with protons in the energy range of 1 - 3 MeV from the particle accelerator. Characteristic x-rays emitted from the sample are detected with an x-ray spectrometer, and the emission spectrum is fit using known spectral line energies to determine elemental composition of the sample. Capabilities of the new PIXE analysis system, including a new state-of-the-art x-ray spectrometer and multi-sample target system, will be presented, and proposed multidisciplinary applications, such as in geology, will be discussed.;

504 a| Includes bibliographical references.;

650 0 a| Proton-induced X-ray emission.=| ^A470165;

700 1 a| Shinpaugh, Jefferson L.,e| degree supervisor.?| UNAUTHORIZED;

710 2 a| East Carolina University.b| Department of Physics.?| UNAUTHORIZED;

856 40 z| Access via ScholarShipu| http://hdl.handle.net/10342/7464;

949 o| wjh;

994 a| C0b| ERE;

596 a| 1 4;

998 a| 5168831;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 5168831-1001l| JNETm| JOYNERr| Ys| Yt| JNE3ETDu| 8/27/2019x| ETDz| JERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 5168831-2001l| HSLELECm| HSLr| Ys| Yt| HEETDu| 8/27/2019x| ETDz| HERESOURCE;

Development of a proton induced x-ray emission (PIXE) material analysis system / by James William Eisenmann III.

Author/creator	Eisenmann, James William, III author.
Other author	Shinpaugh, Jefferson L., degree supervisor.
Other author	East Carolina University. Department of Physics.
Format	Theses and dissertations
Publication	[Greenville, N.C.] : [East Carolina University], 2019.
Description	138 pages : illustrations (chiefy color)
Supplemental Content	Access via ScholarShip
Subjects	Proton-induced X-ray emission.

Summary	A material analysis system using particle-induced x-ray emission (PIXE) analysis has been developed to measure trace element composition in a wide range of samples. The system was constructed in the particle accelerator laboratory in the Department of Physics at East Carolina University, and includes a new high-vacuum beamline on the 2-million-volt tandem Pelletron ion accelerator, which includes a modified multi-sample target chamber. PIXE analysis can provide sensitivities to the parts-per-million level or better for many elements. In this method, a sample is irradiated with protons in the energy range of 1 - 3 MeV from the particle accelerator. Characteristic x-rays emitted from the sample are detected with an x-ray spectrometer, and the emission spectrum is fit using known spectral line energies to determine elemental composition of the sample. Capabilities of the new PIXE analysis system, including a new state-of-the-art x-ray spectrometer and multi-sample target system, will be presented, and proposed multidisciplinary applications, such as in geology, will be discussed.
General note	Presented to the faculty of the Department of Physics
General note	Advisor: Jefferson Shinpaugh
General note	Title from PDF t.p. (viewed October 15, 2019).
Dissertation note	M.S. East Carolina University 2019.
Bibliography note	Includes bibliographical references.
Technical details	System requirements: Adobe Reader.
Technical details	Mode of access: World Wide Web.

Development of a proton induced x-ray emission (PIXE) material analysis system / by James William Eisenmann III.

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