SIGMETRICS '17 abstracts proceedings of the 2017 ACM SIGMETRICS / International Conference on Measurement and Modeling of Computer Systems : June 5-9, 2017, Urbana-Champaign, IL, USA / ACM-Sigmetrics.

Author/creator ACM-Sigmetrics
Other author International Conference on Measurement and Modeling of Computer Systems.
Other author ACM Digital Library.
Format Electronic
Publication Info[S.l.] : ACM,
Supplemental ContentFull text available from ACM Digital Library

General noteTitle from content provider.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
ISBN9781450350327
ISBN1450350321

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