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020 a| 0323497780q| (hbk.);

020 a| 9780323497787q| (hbk.);

020 z| 9780323497794q| (ePub ebook);

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245 00 a| Nanocharacterization techniquesh| [electronic resource] /c| edited by Alessandra L. Da Róz, Marystela Ferreira, Fabio de Lima Leite, Osvaldo N. Oliveira Jr.;

260 a| Oxford :b| William Andrew, imprint of Elsevier,c| 2017.;

300 a| xi, 209 pages :b| illustrations, charts ;c| 24 cm;

490 0 a| Micro and nano technologies series;

504 a| Includes bibliographical references and index.;

505 0 a| Scanning electron microscopy / Marcelo de Assumpocao Pereira-da-Silva, FAbio A. Ferri -- Atomic force microscopy: a powerful tool for electrical characterization / Ronald Taram, Pamela S. Garcia, Daiana K. Deda, Jose A. Varela, Fabio de Lima Leite -- Spectroscopic techniques for characterization of nanomaterials / Priscila Alessio, Pedro H.B. Aoki, Leonardo N. Furini, Alvaro E. Aligag, Carlos J. Leopoldo Constantino -- Dynamic light scattering applied to nanoparticle characterization / Ana P. Ramos -- X-ray diffraction and scattering by nanomaterials / Diego G. Lamas, Mario de Oliveira Neto, Guinther Kellermann, Aldo F. Craievich -- Surface plasmon resonance (SPR) for sensors and biosensors / Celina M. Miyaszaki, Flavio M. Schimizu, Marystela Ferreira.;

506 a| Available only to authorized users.;

520 a| This book covers the main characterization techniques used in nanomaterials and nanostructures. The chapters focus on the fundamental aspects of characterization techniques and their distinctive approaches. Significant advances that have taken place over recent years in refining techniques are covered, and the mathematical foundations needed to use the techniques are also explained in detail.;

538 a| Mode of access: World Wide Web;

650 0 a| Nanostructured materials.=| ^A584488;

650 0 a| Nanotechnologyx| Research.=| ^A1244409;

650 7 a| Nanostructured materials.2| fast0| (OCoLC)fst01032630;

650 7 a| Nanotechnologyx| Research.2| fast0| (OCoLC)fst01911108;

655 0 a| Electronic books.=| ^A491897;

700 1 a| Róz, Alessandra Luzia da.?| UNAUTHORIZED;

700 1 a| Ferreira, Marystela.?| UNAUTHORIZED;

700 1 a| Leite, Fábio de Lima.?| UNAUTHORIZED;

700 1 a| Oliveira, Osvaldo N.,c| Jr.?| UNAUTHORIZED;

776 08 i| Ebook version :z| 9780323497794;

856 40 z| Full text available from eBook - Materials Science 2017 [EBCMS17]u| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fwww.sciencedirect.com%2Fscience%2Fbook%2F9780323497787;

947 a| (OCoLC)ocn962895715;

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949 a| CLICK ON WEB ADDRESSw| ASISh| HSL77;

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999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 5246586-1001l| JNETm| JOYNERr| Ys| Yt| JNESSBKu| 2/17/2020x| EBOOKz| JERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 5246586-2001l| HSLELECm| HSLr| Ys| Yt| HEBKu| 2/17/2020x| EBOOKz| HERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 5246586-3001l| MNETm| JMUSICr| Ys| Yt| MNESSBKu| 2/17/2020x| EBOOKz| JERESOURCE;

Nanocharacterization techniques / edited by Alessandra L. Da Róz, Marystela Ferreira, Fabio de Lima Leite, Osvaldo N. Oliveira Jr.

Format	Electronic
Publication Info	Oxford : William Andrew, imprint of Elsevier, 2017.
Description	xi, 209 pages : illustrations, charts ; 24 cm
Supplemental Content	Full text available from eBook - Materials Science 2017 [EBCMS17]
Subjects	Nanostructured materials. Nanotechnology--Research.

Other author/creator	Róz, Alessandra Luzia da.
Other author/creator	Ferreira, Marystela.
Other author/creator	Leite, Fábio de Lima.
Other author/creator	Oliveira, Osvaldo N., Jr.
Series	Micro and nano technologies series
Contents	Scanning electron microscopy / Marcelo de Assumpocao Pereira-da-Silva, FAbio A. Ferri -- Atomic force microscopy: a powerful tool for electrical characterization / Ronald Taram, Pamela S. Garcia, Daiana K. Deda, Jose A. Varela, Fabio de Lima Leite -- Spectroscopic techniques for characterization of nanomaterials / Priscila Alessio, Pedro H.B. Aoki, Leonardo N. Furini, Alvaro E. Aligag, Carlos J. Leopoldo Constantino -- Dynamic light scattering applied to nanoparticle characterization / Ana P. Ramos -- X-ray diffraction and scattering by nanomaterials / Diego G. Lamas, Mario de Oliveira Neto, Guinther Kellermann, Aldo F. Craievich -- Surface plasmon resonance (SPR) for sensors and biosensors / Celina M. Miyaszaki, Flavio M. Schimizu, Marystela Ferreira.
Abstract	This book covers the main characterization techniques used in nanomaterials and nanostructures. The chapters focus on the fundamental aspects of characterization techniques and their distinctive approaches. Significant advances that have taken place over recent years in refining techniques are covered, and the mathematical foundations needed to use the techniques are also explained in detail.
Bibliography note	Includes bibliographical references and index.
Access restriction	Available only to authorized users.
Technical details	Mode of access: World Wide Web
Issued in other form	Ebook version : 9780323497794
Genre/form	Electronic books.
LCCN	2017935077
ISBN	0323497780 (hbk.)
ISBN	9780323497787 (hbk.)
ISBN	(ePub ebook)

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Nanocharacterization techniques / edited by Alessandra L. Da Róz, Marystela Ferreira, Fabio de Lima Leite, Osvaldo N. Oliveira Jr.

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