An initial calibration of a proton induced x-ray emission (PIXE) material analysis system using GUPIXWin / by Robert Michael Seip.

Author/creator Seip, Robert Michael author.
Other author Shinpaugh, Jefferson L., degree supervisor.
Other author East Carolina University. Department of Physics.
Format Theses and dissertations
Publication[Greenville, N.C.] : [East Carolina University], 2020.
Description100 pages : illustrations (some color)
Supplemental ContentAccess via ScholarShip
Subjects

Summary Proton induced x-ray emission (PIXE) technology has been used extensively over the last few decades to perform highly accurate multi-elemental trace element analyses with much success. The recent implementation of a new PIXE experimental chamber at East Carolina University required a qualification and calibration of the Amptek Fast SDD©, a new state of the art silicon drift diode (SDD) detector, and GUPIXWin, a highly utilized analysis software package. Using 55Fe, a radioactive x-ray source, the detector performed as expected with a resolution of (130 ± 4) eV and a peak to background ratio of 19 000 ± 1000:1. Several thin and thick, mono- and bi-elemental standards were selected to calibrate and calculate the H parameter necessary for trace element concentrations. An energy dependent set of values for H [almost equal to] 0:002 was determined. Finally, the calibration settings were tested by performing a trace element to matrix element ratio analysis on striped bass otoliths from a previous experiment. These results were compared to the previously collected data with few ratios in agreement. Of all analyzed element ratios, Mn:Ca had the most agreement. Some ratios were nearly one order of magnitude different. Recommendations for beam current settings and further calibrations were made.
General notePresented to the faculty of the Department of Physics
General noteAdvisor: Robert Michael Seip
General noteTitle from PDF t.p. (viewed July 15, 2021).
Dissertation noteM.S. East Carolina University 2020.
Bibliography noteIncludes bibliographical references.
Technical detailsSystem requirements: Adobe Reader.
Technical detailsMode of access: World Wide Web.