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010 a| 2015049975;

020 a| 9781118700204 (Adobe PDF);

020 a| 9781118700211 (ePub);

020 z| 9781118700235 (cloth);

035 a| (WaSeSS)ssj0001635958;

042 a| pcc;

049 a| EREEa| NEHH;

050 00 a| TA169.3;

082 00 a| 621.381028/72| 23;

100 1 a| Gray, Kirk.?| UNAUTHORIZED;

245 10 a| Next generation HALT and HASSh| [electronic resource] :b| robust design of electronics and systems /c| by Kirk Gray, John James Paschkewitz.;

260 a| Chichester, UK ;a| Hoboken, NJ :b| John Wiley & Sons,c| 2016.;

300 a| 1 online resource.;

504 a| Includes bibliographical references and index.;

505 0 a| Basis and limitations of typical current reliability methods & metrics -- The need for reliability assurance metrics to change -- Challenges to advancing electronics reliability engineering -- A new deterministic reliability development paradigm -- Common understanding of HALT approach is critical for success -- The fundamentals of HALT -- Highly accelerated stress screening (HALT) and audits (HASA) -- HALT benefits for software/firmware performance and reliability -- Quantitative accelerated life test -- Failure analysis and corrective action -- Additional applications of HALT methods.;

506 a| Available only to authorized users.;

538 a| Mode of access: World Wide Web;

588 a| Description based on print version record and CIP data provided by publisher.;

650 0 a| Accelerated life testing.=| ^A332944;

650 0 a| Electronic systemsx| Design and construction.=| ^A650917;

650 0 a| Electronic systemsx| Testing.=| ^A650917;

655 0 a| Electronic books.=| ^A491897;

700 1 a| Paschkewitz, John James.?| UNAUTHORIZED;

776 08 i| Print version:a| Gray, Kirk, author.t| Next generation HALT and HASSd| Chichester, UK ; Hoboken, NJ : John Wiley & Sons, 2016z| 9781118700235w| (DLC) 2015044935;

856 40 z| Full text available from Ebook Central - Academic Completeu| https://ebookcentral.proquest.com/lib/eastcarolina/detail.action?docID=4451897;

949 a| CLICK ON WEB ADDRESSw| ASISh| JOYNER188;

949 a| CLICK ON WEB ADDRESSw| ASISh| HSL77;

949 a| CLICK ON WEB ADDRESSw| ASISh| JMUSIC60;

596 a| 1 3 4;

998 a| 5609847;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 5609847-1001l| JNETm| JOYNERr| Ys| Yt| JNESSBKu| 4/18/2021x| EBOOKz| JERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 5609847-2001l| HSLELECm| HSLr| Ys| Yt| HEBKu| 4/18/2021x| EBOOKz| HERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 5609847-3001l| MNETm| JMUSICr| Ys| Yt| MNESSBKu| 4/18/2021x| EBOOKz| JERESOURCE;

Next generation HALT and HASS robust design of electronics and systems / by Kirk Gray, John James Paschkewitz.

Author/creator	Gray, Kirk
Other author	Paschkewitz, John James.
Format	Electronic
Publication Info	Chichester, UK ; Hoboken, NJ : John Wiley & Sons, 2016.
Description	1 online resource.
Supplemental Content	Full text available from Ebook Central - Academic Complete
Subjects	Accelerated life testing. Electronic systems--Design and construction. Electronic systems--Testing.

Contents	Basis and limitations of typical current reliability methods & metrics -- The need for reliability assurance metrics to change -- Challenges to advancing electronics reliability engineering -- A new deterministic reliability development paradigm -- Common understanding of HALT approach is critical for success -- The fundamentals of HALT -- Highly accelerated stress screening (HALT) and audits (HASA) -- HALT benefits for software/firmware performance and reliability -- Quantitative accelerated life test -- Failure analysis and corrective action -- Additional applications of HALT methods.
Bibliography note	Includes bibliographical references and index.
Access restriction	Available only to authorized users.
Technical details	Mode of access: World Wide Web
Source of description	Description based on print version record and CIP data provided by publisher.
Issued in other form	Print version: Gray, Kirk, author. Next generation HALT and HASS Chichester, UK ; Hoboken, NJ : John Wiley & Sons, 2016 9781118700235
Genre/form	Electronic books.
LCCN	2015049975
ISBN	9781118700204 (Adobe PDF)
ISBN	9781118700211 (ePub)

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Next generation HALT and HASS robust design of electronics and systems / by Kirk Gray, John James Paschkewitz.

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