Microstructural characterization of materials / David Brandon and Wayne Kaplan.
| Author/creator | Brandon, D. G. |
| Other author | Kaplan, Wayne D. |
| Format | Electronic |
| Edition | 2nd ed. |
| Publication Info | Chichester, England : John Wiley & Sons, |
| Description | xiv, 536 p. : ill. (some col.) ; 25 cm. |
| Supplemental Content | Full text available from eBooks on EBSCOhost |
| Subjects |
| Series | Quantitative software engineering series |
| Bibliography note | Includes bibliographical references and index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2007041704 |
| ISBN | 9780470027844 (cloth) |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | Access Content Online | ✔ Available |