Quantitative data processing in scanning probe microscopy SPM applications for nanometrology / Petr Klapetek.
| Author/creator | Klapetek, Petr |
| Format | Electronic |
| Edition | Second edition. |
| Publication Info | Amsterdam, Netherlands : Elsevier, [2018] |
| Description | xviii, 397 pages : illustrations; 24 cm. |
| Supplemental Content | Full text available from eBook - Materials Science 2018 |
| Subjects |
| Series | Micro & nano technologies series |
| Bibliography note | Includes bibliographical references and index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2017962466 |
| ISBN | 9780128133477 (pbk.) |
| ISBN | 0128133473 (pbk.) |