2016 IEEE 22nd International Symposium on on Line Testing and Robust System Design (IOLTS)

Author/creator IEEE Staff
Other author IEEE Xplore (Online service)
Format Electronic
Publication InfoPiscataway : IEEE
Supplemental ContentFull text available from IEEE Electronic Library (IEL) Conference Proceedings
Supplemental ContentFull text available from IEEE Electronic Library (IEL)
Subjects

Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
ISBN9781509015085
ISBN1509015086 (Spiral) Active Record
Stock number00066573