Small aperture analysis of the dual TEM cell and an investigation of test object scattering in a single TEM cell / P.F. Wilson, M.T. Ma.

Author/creator Wilson, Perry F. author.
Other author Ma, Mark T. author.
Other author United States. National Bureau of Standards, issuing body.
Format Microform
PublicationWashington, D.C. : U.S. Dept. of Commerce, National Bureau of Standards : For sale by Supt. of Docs., U.S. G.P.O., 1984.
Description55 pages in various pagings : illustrations ; 28 cm.
Subjects

SeriesNBS technical note ; 1076
NBS technical note ; https://id.loc.gov/authorities/names/n42033257 ; 1076. ^A4336
General noteDistributed to depository libraries in microfiche.
General note"Issued October 1983."
General noteGPO Historic Shelflist Project- publication not in hand.
General noteGPO Cataloging Record Distribution Program (CRDP).
Bibliography noteIncludes bibliographical references (pages 24-29).
Reproduction noteMicrofiche. Washington, D.C. : U.S. G.P.O., 1984. 1 microfiche : negative ; 11 x 15 cm.
GPO item number0249-A (MF)
Govt. docs number C 13.46:1076

Availability

Library Location Call Number Status Item Actions
Joyner Microforms B300 C 13.46:1076 ✔ Available