6th International Symposium on Quality Electronic Design proceedings : March 21-23, 2005, San Jose, California / sponsored by IEEE Electron Devices Society (EDS) ... [et al.].

Author/creator International Symposium on Quality Electronic Design
Other author IEEE Electron Devices Society.
Other author IEEE Xplore (Online service)
Format Electronic
Publication InfoLos Alamitos, Calif. : IEEE Computer Society,
Descriptionxxiii, 710 p. : ill. ; 27 cm.
Supplemental ContentFull text available from IEEE Electronic Library (IEL)
Supplemental ContentFull text available from IEEE Conference Proceedings Archive 2005-2009
Supplemental ContentFull text available from IEEE Electronic Library (IEL) Conference Proceedings
Subjects
Integrated circuits--Very large scale integration. --Reliability. --Congresses.
Integrated circuits--Very large scale integration. --Design and construction. --Congresses.
Integrated circuits--Very large scale integration. --Computer-aided design. --Congresses.
Integrated circuits--Very large scale integration. --Testing. --Quality control. --Congresses.

Cover title ISQED 2005
General noteOn cover: ISQED 2005.
General note"IEEE Computer Society Order Number P2301"--T.p. verso.
Bibliography noteIncludes bibliographical references and author index.
Access restrictionAvailable only to authorized users.
Other formsAlso issued online with additional title: Quality of Electronic Design, 2005, ISQED 2005, Sixth International Symposium on.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
Other titleQuality of Electronic Design, 2005, ISQED 2005, Sixth International Symposium on.
LCCN 2004117594
ISBN0769523013

Availability

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