2005 IEEE International Integrated Reliability Workshop final report Stanford Sierra Conference Center, S. Lake Tahoe, California, October 17-20, 2005 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
| Author/creator | International Integrated Reliability Workshop |
| Other author | IEEE Electron Devices Society. |
| Other author | IEEE Reliability Society. |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Piscataway, N.J. : IEEE Electron Devices Society ; IEEE Reliability Society, |
| Description | vi, 182 p. : ill. ; 28 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive 2005-2009 |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Subjects |
| Portion of title | IIRW 2005 |
| Portion of title | Integrated reliability workshop |
| Running title | 2005 IIRW final report |
| General note | At head of title: IEEE. |
| General note | "IEEE Catalog No.: 05TH8799"--T.p. verso. |
| Bibliography note | Includes bibliographical references. |
| Access restriction | Available only to authorized users. |
| Other forms | Also issued online. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2005920974 |
| ISBN | 0780389921 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |