2005 IEEE International Workshop on Memory Technology, Design and Testing MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan / IEEE Computer Society Test Technology Technical Council ; co-sponsored by National Tsing Hua University.
| Author/creator | IEEE International Workshop on Memory Technology, Design, and Testing |
| Other author | IEEE Computer Society. Technical Council on Test Technology. |
| Other author | Guo li qing hua da xue (Hsinchu City, Taiwan) |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | Los Alamitos, Calif. : IEEE Computer Society, |
| Description | xxv, 153 p. : ill. ; 27 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive 2005-2009 |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Subjects |
| Portion of title | MTDT 2005 |
| Portion of title | Memory technology, design and testing |
| General note | "IEEE Computer Society Order Number P2313"--T.p. verso. |
| Bibliography note | Includes bibliographical references and author index. |
| Access restriction | Available only to authorized users. |
| Other forms | Also issued online with additional title: Memory Technology, Design, and Testing, 2005, MTDT 2005, 2005 IEEE International Workshop on. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| Other title | Memory Technology, Design, and Testing, 2005, MTDT 2005, 2005 IEEE International Workshop on. |
| LCCN | 2006278060 |
| ISBN | 0769523137 |