2006 IEEE International Integrated Reliability Workshop final report Stanford Sierra Conference Center, S. Lake Tahoe, California, October 16-19, 2006 / sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.

Author/creator International Integrated Reliability Workshop
Other author IEEE Electron Devices Society.
Other author IEEE Reliability Society.
Other author IEEE Xplore (Online service)
Format Electronic
Publication InfoPiscataway, NJ : Electron Devices Society ; Reliability Society of the Institute of Electrical and Electronics Engineers,
Descriptionvi, 230 p. : ill. ; 28 cm.
Supplemental ContentFull text available from IEEE Electronic Library (IEL)
Supplemental ContentFull text available from IEEE Conference Proceedings Archive 2005-2009
Supplemental ContentFull text available from IEEE Electronic Library (IEL) Conference Proceedings
Subjects
Integrated circuits--Reliability. --Congresses.
Integrated circuits--Wafer-scale integration. --Reliability. --Congresses.

General note"IEEE Catalog No.: 06TH8877"--T.p. verso.
General noteVols. for 2007- cataloged as a serial at LC.
Bibliography noteIncludes bibliographical references and index.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 2008270100
ISBN1424402964 (pbk.)