2006 IEEE International Test Conference Santa Clara, CA : 22-27 October 2006.

Author/creator International Test Conference
Other author Institute of Electrical and Electronics Engineers. Philadelphia Section.
Other author IEEE Xplore (Online service)
Format Electronic
Publication InfoPiscataway, NJ : Institute of Electrical and Electronics Engineers (IEEE),
Description2 v. (xiv, 1098 p.) : ill. ; 28 cm.
Supplemental ContentFull text available from IEEE Conference Proceedings Archive 2005-2009
Supplemental ContentFull text available from IEEE Electronic Library (IEL)
Supplemental ContentFull text available from IEEE Electronic Library (IEL) Conference Proceedings
Subjects
Integrated circuits--Testing. --Congresses.
Electronic digital computers--Circuits. --Testing. --Congresses.
Telecommunication--Congresses.
Radio frequency--Congresses.

General note"IEEE Catalog Number 06CH37787."
Bibliography noteIncludes bibliographical references and index.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 2007275204
ISBN1424402913 (set)