2006 IEEE International Workshop on Memory Technology, Design, and Testing 2-4 August 2006, Taipei, Taiwan : proceedings / sponsored by IEEE Computer Society, Technical Council on Testing Technology (TTTC), Technical Committee on VLSI : co-sponsored by National Tsing-Hus University, Taiwan, Ministry of Education, Taiwan : in-cooperation with IEEE Circuits and Systems Society, IEEE Solid-State Circuits Society.

Author/creator IEEE International Workshop on Memory Technology, Design, and Testing
Other author IEEE Computer Society. Technical Council on Test Technology.
Other author IEEE Computer Society. Technical Committee on VLSI.
Other author IEEE Xplore (Online service)
Format Electronic
Publication InfoLos Alamitos, Calif. : IEEE Computer Society,
Descriptionxviii, 83 p. : ill. ; 28 cm.
Supplemental ContentFull text available from IEEE Electronic Library (IEL)
Supplemental ContentFull text available from IEEE Conference Proceedings Archive 2005-2009
Supplemental ContentFull text available from IEEE Electronic Library (IEL) Conference Proceedings
Subjects
Semiconductor storage devices--Testing. --Congresses.
Random access memory--Congresses.

Cover title MTDT '06
Spine title Proceedings of the IEEE Workshop on Memory Technology, Design, and Testing
General note"IEEE Computer Society order number P2572"--T.p. verso.
Bibliography noteIncludes bibliographical references and index.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 2006285152
ISBN9780769525723 (pbk.)
ISBN0769525725 (pbk.)