2007 International Symposium on VLSI Design, Automation & Test (VLSI-DAT) April 25-27, 2007, Hsinchu, Taiwan / Industrial Technology Research Institute, IEEE.

Portion of title International Symposium on VLSI Design, Automation & Test (VLSI-TSA)
General note"IEEE catalog number: 07TH8910."
Bibliography noteIncludes bibliographical references.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 2006931084
ISBN1424405823 (pbk. ed.)

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