21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems proceedings : Arlington, Virginia, USA, October 4-6, 2006 / [edited by Nohpill Park ... [et al.]] ; sponsored by the IEEE Computer Society Test Technology Technical Council ; the IEEE Computer Society Technical Committee on Fault-Tolerant Computing.
| Author/creator | IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems |
| Format | Electronic |
| Publication Info | Los Alamitos, Calif. : IEEE Computer Society Press, |
| Description | xii, 583 p. : ill. ; 23 cm. |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) |
| Supplemental Content | Full text available from IEEE Conference Proceedings Archive 2005-2009 |
| Supplemental Content | Full text available from IEEE Electronic Library (IEL) Conference Proceedings |
| Subjects |
| Other author/creator | Park, Nohpill. |
| Other author/creator | IEEE Computer Society. Fault-Tolerant Computing Technical Committee. |
| Other author/creator | IEEE Computer Society. Test Technology Technical Committee. |
| Other author/creator | IEEE Xplore (Online service) |
| Portion of title | International Symposium on Defect and Fault Tolerance in VLSI Systems |
| Portion of title | Defect and fault tolerance in VLSI systems |
| Added title page | DFT'06 |
| General note | "IEEE Computer Society Order Number P2706"--T.p. verso. |
| Bibliography note | Includes bibliographical references and author index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2007296547 |
| ISBN | 076952706X |
| ISBN | 9780769527062 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |