Tools

LEADER 03639cam 22006377a 4500

001 ssj0000394403;

003 WaSeSS;

005 20240612185429.0;

006 m d ;

007 cr n ;

008 051004s2006 caua sb 101 0ceng d;

010 a| 2005935111;

020 a| 0769525008;

035 a| (WaSeSS)ssj0000394403;

042 a| lccopycat;

049 a| EREEa| NEHH;

050 00 a| TK7874b| .I3237 2006;

082 00 a| 621.3812| 22;

111 2 a| IEEE International Workshop on Electronic Design, Test and Applicationsn| (3rd :d| 2006 :c| Kuala Lumpur, Malaysia)?| UNAUTHORIZED;

245 10 a| Third IEEE International Workshop on Electronic Design, Test, and Applications : proceedings, 17-19 January 2006, Kuala Lumpur, Malaysiah| [electronic resource] /c| edited by Patrick Girard, Adam Osseiran, and Moi-Tin Chew ; sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), IEEE Malaysia Section, Monash University, Malaysia ; with industrial co-sponsorship from National Instruments ; in cooperation with Freescale Semiconductor Malaysia ... [et al.].;

246 14 a| DELTA 2006;

246 30 a| International Workshop on Electronic Design, Test, and Applications;

246 30 a| Electronic Design, Test and Applications;

260 a| Los Alamitos, Calif. :b| IEEE Computer Society,;

300 a| xvii, 521 p. :b| ill. ;c| 28 cm.;

500 a| "IEEE Computer Society Order Number P2500"--T.p. verso.;

504 a| Includes bibliographical references and index.;

506 a| Available only to authorized users.;

530 a| Also issued online.;

538 a| Mode of access: World Wide Web;

650 0 a| Integrated circuitsx| Testingv| Congresses.=| ^A598122;

650 0 a| Integrated circuitsx| Design and constructionv| Congresses.=| ^A534337;

650 0 a| Microelectronicsx| Designv| Congresses.=| ^A35901;

650 0 a| Microelectronicsx| Testingv| Congresses.=| ^A35901;

655 0 a| Electronic books.=| ^A491897;

700 1 a| Girard, Patrick,c| Ph. D.?| UNAUTHORIZED;

700 1 a| Osseiran, Adam.?| UNAUTHORIZED;

700 1 a| Chew, Moi-Tin.?| UNAUTHORIZED;

710 2 a| IEEE Computer Society.b| Technical Council on Test Technology.=| ^A728178;

710 2 a| IEEE Malaysia Section.?| UNAUTHORIZED;

710 2 a| Monash University Malaysia.?| UNAUTHORIZED;

710 2 a| National Instruments (Firm)?| UNAUTHORIZED;

710 2 a| IEEE Xplore (Online service)=| ^A534875;

856 40 z| Full text available from IEEE Electronic Library (IEL)u| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D10553;

856 40 z| Full text available from IEEE Conference Proceedings Archive 2005-2009u| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D10553;

856 40 z| Full text available from IEEE Electronic Library (IEL) Conference Proceedingsu| https://go.openathens.net/redirector/ecu.edu?url=https%3A%2F%2Fieeexplore.ieee.org%2Fservlet%2Fopac%3Fpunumber%3D10553;

947 a| (OCoLC)ocm63201884;

949 a| CLICK ON WEB ADDRESSw| ASISh| JOYNER188;

949 a| CLICK ON WEB ADDRESSw| ASISh| HSL77;

949 a| CLICK ON WEB ADDRESSw| ASISh| JMUSIC60;

596 a| 1 3 4;

998 a| 5937453;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 5937453-1001l| JNETm| JOYNERr| Ys| Yt| JNESSBKu| 11/16/2022x| EBOOKz| JERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 5937453-2001l| HSLELECm| HSLr| Ys| Yt| HEBKu| 11/16/2022x| EBOOKz| HERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 5937453-3001l| MNETm| JMUSICr| Ys| Yt| MNESSBKu| 11/16/2022x| EBOOKz| JERESOURCE;

Third IEEE International Workshop on Electronic Design, Test, and Applications : proceedings, 17-19 January 2006, Kuala Lumpur, Malaysia / edited by Patrick Girard, Adam Osseiran, and Moi-Tin Chew ; sponsored by IEEE Computer Society Test Technology Technical Council (TTTC), IEEE Malaysia Section, Monash University, Malaysia ; with industrial co-sponsorship from National Instruments ; in cooperation with Freescale Semiconductor Malaysia ... [et al.].

Author/creator	IEEE International Workshop on Electronic Design, Test and Applications
Format	Electronic
Publication Info	Los Alamitos, Calif. : IEEE Computer Society,
Description	xvii, 521 p. : ill. ; 28 cm.
Supplemental Content	Full text available from IEEE Electronic Library (IEL)
Supplemental Content	Full text available from IEEE Conference Proceedings Archive 2005-2009
Supplemental Content	Full text available from IEEE Electronic Library (IEL) Conference Proceedings
Subjects	Integrated circuits--Testing. --Congresses. Integrated circuits--Design and construction. --Congresses. Microelectronics--Design. --Congresses. Microelectronics--Testing. --Congresses.

Other author/creator	Girard, Patrick, Ph. D.
Other author/creator	Osseiran, Adam.
Other author/creator	Chew, Moi-Tin.
Other author/creator	IEEE Computer Society. Technical Council on Test Technology.
Other author/creator	IEEE Malaysia Section.
Other author/creator	Monash University Malaysia.
Other author/creator	National Instruments (Firm)
Other author/creator	IEEE Xplore (Online service)
Cover title	DELTA 2006
Portion of title	International Workshop on Electronic Design, Test, and Applications
Portion of title	Electronic Design, Test and Applications
General note	"IEEE Computer Society Order Number P2500"--T.p. verso.
Bibliography note	Includes bibliographical references and index.
Access restriction	Available only to authorized users.
Other forms	Also issued online.
Technical details	Mode of access: World Wide Web
Genre/form	Electronic books.
LCCN	2005935111
ISBN	0769525008

Availability

Library	Location	Call Number	Status	Item Actions
	Electronic Resources	Online Content Full text available from IEEE Electronic Library (IEL) Full text available from IEEE Electronic Library (IEL) Full text available from IEEE Electronic Library (IEL)	✔ Available

Click here for more information about this title

Availability