Proceedings of the ... IEEE VLSI Test Symposium VTS.
| Author/creator | IEEE VLSI Test Symposium |
| Other author | IEEE Computer Society. Test Technology Technical Committee. |
| Other author | Institute of Electrical and Electronics Engineers. Philadelphia Section. |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | [Los Alamitos, Calif.] : [IEEE Computer Society Press] |
| Supplemental Content | Click here for full text |
| Subjects |
| Uniform title | Proceedings of the ... IEEE VLSI Test Symposium (Online) |
| Portion of title | IEEE VLSI Test Symposium |
| Portion of title | IEEE Very Large Scale Integration Test Symposium |
| Portion of title | VLSI Test Symposium |
| Variant title | Very Large Scale Integration Test Symposium |
| Portion of title | VTS |
| Portion of title | Proceedings ... IEEE ... VLSI Test Symposium |
| Frequency | Annual |
| Access restriction | Available only to authorized users. |
| Other forms | Also available in print. |
| Technical details | Mode of access: World Wide Web. |
| Issuing body | Print version sponsored by the IEEE Computer Society Technical Committee on Test Technology [and] IEEE Philadelphia Section. |
| Title history note | Original print version of this title was preceded by an earlier title called: IEEE VLSI Test Symposium. Digest of papers. |
| Source of description | 13th (1995); title from PDF running title (IEEE Digital Library Web site, viewed on November 2, 2005). |
| Source of description | 38th (2020) (IEEE Xplore website, viewed July 31, 2020). |
| Genre/form | Electronic journals. |
| LCCN | 2005262240 |
| ISSN | 2375-1053 1093-0167 |