Terrestrial neutron-induced soft errors in advanced memory devices / Takashi Nakamura ... [et al.].
| Other author | Nakamura, Takashi, 1939- |
| Format | Electronic |
| Publication Info | Hackensack, NJ : World Scientific, |
| Description | xxii, 343 p. : ill. (some col.) ; 24 cm. |
| Supplemental Content | Full text available from Ebook Central - Academic Complete |
| Subjects |
| Contents | Introduction -- Terrestrial neutron spectrometry and dosimetry -- Irradiation testing in the terrestrial field -- Neutron irradiation test facilities -- Review and discussion of experimental data -- Monte Carlo simulation methods -- Simulation results and their implications -- International standardization of the neutron test method -- Summary and challenges. |
| Bibliography note | Includes bibliographical references (p. 291-315) and index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 2008298667 |
| ISBN | 9789812778819 |
| ISBN | 9812778810 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | Access Content Online | ✔ Available |