On-Wafer calibration techniques enabling accurate characterization of high-performance silicon devices at the mm-wave range and beyond / Rumiantsev, Andrej.
| Author/creator | Rumiantsev, Andrej |
| Format | Electronic |
| Publication Info | [S.l.] : River Publishers, |
| Supplemental Content | Full text available from Taylor & Francis eBooks |
| Supplemental Content | Full text available from Ebook Central - Academic Complete |
| General note | Title from content provider. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |