Defect Based Testing, Proceedings. IEEE International Workshop on
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Supplemental Content | Click here for full text |
| Uniform title | Defect Based Testing, Proceedings. IEEE International Workshop on (Online) |
| Access restriction | Available only to authorized users. |
| Other forms | Also available in print. |
| Technical details | Mode of access: World Wide Web. |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | Access Content Online | ✔ Available |