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111 2 a| IEEE International On-Line Testing Workshop.?| UNAUTHORIZED;

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362 0 a| -8th (2002).;

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550 a| Sponsored by: IEEE Computer Society Test Technology Technical Council.;

588 a| Description based on: 6th (2000); title from PDF version of original t.p. (viewed Aug. 10, 2001).;

650 0 a| Electronic circuitsx| Testingv| Congresses.=| ^A323721;

650 0 a| Online data processingv| Congresses.=| ^A1240685;

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650 0 a| Error-correcting codes (Information theory)v| Congresses.=| ^A24917;

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710 2 a| IEEE Computer Society.b| Technical Council on Test Technology.=| ^A728178;

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Proceedings / IEEE International On-Line Testing Workshop.

Author/creator	IEEE International On-Line Testing Workshop
Other author	Institute of Electrical and Electronics Engineers.
Other author	IEEE Computer Society. Technical Council on Test Technology.
Other author	IEEE Xplore (Online service)
Format	Electronic
Publication Info	Los Alamitos, Calif. : IEEE Computer Society ; Piscataway, NJ : IEEE Service Center, -2002.
Supplemental Content	Click here for full text
Subjects	Electronic circuits--Testing. --Congresses. Online data processing--Congresses. Electronic circuit design--Congresses. Error-correcting codes (Information theory)--Congresses.

Uniform title	Proceedings (Online)
Variant title	IEEE International On-Line Testing Workshop
Variant title	Title on IEEE Computer Society Proceedings list: IOLTW
Frequency	Annual
Access restriction	Available only to authorized users.
Other forms	Also available in print.
Technical details	Mode of access: World Wide Web.
Issuing body	Sponsored by: IEEE Computer Society Test Technology Technical Council.
Source of description	Description based on: 6th (2000); title from PDF version of original t.p. (viewed Aug. 10, 2001).
Succeeding title	IEEE International On-Line Testing Symposium. Proceedings (Online). Proceedings 1942-9401
Genre/form	Electronic journals.
LCCN	2001242164
ISSN	1549-3598

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	Electronic Resources	Access Content Online	✔ Available

Proceedings / IEEE International On-Line Testing Workshop.

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