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010 a| 2016202268;

022 0 a| 2472-761X2| 1;

035 a| (WaSeSS)ssj0001615921;

037 b| IEEE, 445 Hoes Lane, Piscataway, NJ 08854-4141;

042 a| pcca| nsdp;

049 a| EREEa| NEHH;

082 10 a| 621.381952| 23;

111 2 a| IEEE East-West Design & Test Symposium.?| UNAUTHORIZED;

210 0 a| East-West Des. Test Symp.b| (Online);

222 0 a| East-West Design and Test Symposiumb| (Online);

240 10 a| ... East-West Design and Test Symposium (Online)?| UNAUTHORIZED;

245 10 a| ... East-West Design and Test Symposiumh| [electronic resource].;

246 1 a| EWDTS ...;

246 1 i| Some issues may have title:a| Proceedings;

246 1 i| Volume for 2010 have title:a| Proceedings of IEEE East-West Disign & Test Symposium;

246 1 a| Proceedings of IEEE East-West Disign and Test Symposium;

246 1 a| IEEE East-West Design & Test International Symposium;

260 a| Piscataway, NJ :b| Institute of Electrical and Electronics Engineers, Inc;

310 a| Annaul;

362 1 a| Print began in 2003?;

506 a| Available only to authorized users.;

530 a| Also available in print.;

538 a| Mode of access: World Wide Web.;

588 a| Description based on: 2008; title from PDF title page (IEEEXplore website, viewed on May 28, 2016)..;

588 a| Latest issue consulted: 2014 (viewed on May 28, 2016).;

650 0 a| Computer engineeringv| Congresses.=| ^A1236872;

650 0 a| Electronic circuit designv| Congresses.=| ^A1237658;

650 0 a| Electronic circuitsx| Testingv| Congresses.=| ^A323721;

650 0 a| Integrated circuitsx| Testingv| Congresses.=| ^A598122;

655 0 a| Electronic journals.=| ^A353035;

710 2 a| Institute of Electrical and Electronics Engineers.=| ^A9546;

710 2 a| Kharkivsʹkyĭ nat͡sionalʹnyĭ universytet radioelektroniky.?| UNAUTHORIZED;

710 2 a| IEEE Xplore (Online service)=| ^A534875;

856 40 z| Click here for full textu| http://JW3MH2CM6N.search.serialssolutions.com/?V=1.0&L=JW3MH2CM6N&S=JCs&C=TC0001615921&T=marc;

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949 a| CLICK ON WEB ADDRESSw| ASISh| HSL79;

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999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 6374818-2001l| HSLELECm| HSLr| Ys| Yt| HELECu| 6/13/2024x| EJOURNALz| HERESOURCE;

999 a| CLICK ON WEB ADDRESSw| ASISc| 1i| 6374818-3001l| MNETm| JMUSICr| Ys| Yt| MNESSJOu| 6/13/2024x| EJOURNALz| JERESOURCE;

... East-West Design and Test Symposium

Author/creator	IEEE East-West Design & Test Symposium
Other author	Institute of Electrical and Electronics Engineers.
Other author	Kharkivsʹkyĭ nat͡sionalʹnyĭ universytet radioelektroniky.
Other author	IEEE Xplore (Online service)
Format	Electronic
Publication Info	Piscataway, NJ : Institute of Electrical and Electronics Engineers, Inc
Supplemental Content	Click here for full text
Subjects	Computer engineering--Congresses. Electronic circuit design--Congresses. Electronic circuits--Testing. --Congresses. Electronic digital computers--Circuits. --Testing. --Congresses. Integrated circuits--Testing. --Congresses.

Uniform title	... East-West Design and Test Symposium (Online)
Variant title	EWDTS ...
Variant title	Some issues may have title: Proceedings
Variant title	Volume for 2010 have title: Proceedings of IEEE East-West Disign & Test Symposium
Variant title	Proceedings of IEEE East-West Disign and Test Symposium
Variant title	IEEE East-West Design & Test International Symposium
Frequency	Annaul
Access restriction	Available only to authorized users.
Other forms	Also available in print.
Technical details	Mode of access: World Wide Web.
Source of description	Description based on: 2008; title from PDF title page (IEEEXplore website, viewed on May 28, 2016)..
Source of description	Latest issue consulted: 2014 (viewed on May 28, 2016).
Issued in other form	Print version: IEEE East-West Design & Test Symposium. ... East-West Design and Test Symposium 2373-826X
Genre/form	Electronic journals.
LCCN	2016202268
ISSN	2472-761X
Stock number	IEEE, 445 Hoes Lane, Piscataway, NJ 08854-4141

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	Electronic Resources	Access Content Online	✔ Available

... East-West Design and Test Symposium

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