IEEE Circuits and Systems International Conference on Testing and Diagnosis ICTD.
| Author/creator | IEEE Circuits and Systems International Conference on Testing and Diagnosis |
| Other author | Institute of Electrical and Electronics Engineers. |
| Other author | IEEE Circuits and Systems Society. |
| Other author | IEEE Xplore (Online service) |
| Format | Electronic |
| Publication Info | [Piscataway, N.J.] : IEEE |
| Supplemental Content | Click here for full text |
| Subjects |
| Uniform title | IEEE Circuits and Systems International Conference on Testing and Diagnosis (Online) |
| Variant title | ICTD |
| Portion of title | International Conference on Testing and Diagnosis |
| Portion of title | Testing and Diagnosis |
| Access restriction | Available only to authorized users. |
| Other forms | Also available in print. |
| Technical details | Mode of access: World Wide Web. |
| Source of description | Description based on: 2009; title from journal information screen (IEL, viewed Nov 25, 2009). |
| Issued in other form | Print version as: IEEE Circuits and Systems International Conference on Testing and Diagnosis. IEEE Circuits and Systems International Conference on Testing and Diagnosis : [proceedings] 2324-8475 |
| Genre/form | Electronic journals. |
| LCCN | 2012204174 |
| ISSN | 2324-8491 |
| Stock number | Institute of Electrical and Electronics Engineers, IEEE Service Center, 445 Hoes Lane, Piscataway, NJ 08854 |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | Access Content Online | ✔ Available |