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111 2 a| International Symposium on VLSI Design, Automation, and Test.?| UNAUTHORIZED;

210 0 a| Proc. Tech. Program Int. Symp. VLSI Des. Autom. Testb| (Online);

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246 1 a| International Symposium on VLSI Design, Automation & Test;

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260 a| Piscataway, NJ :b| IEEE.;

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362 1 a| Began with: 2005.;

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530 a| Also available in print.;

538 a| Mode of access: World Wide Web.;

588 0 a| 2006; title from PDF cover (IEEEXplore website, viewed on June 8, 2016).;

588 1 a| 2016 (viewed on June 8, 2016).;

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780 00 a| International Symposium on VLSI Technology, Systems, and Applications.t| Proceedings of technical papers;

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Proceedings of Technical Program of ... International Symposium on VLSI Design, Automation and Test

Author/creator	International Symposium on VLSI Design, Automation, and Test
Other author	Institute of Electrical and Electronics Engineers.
Other author	IEEE Xplore (Online service)
Format	Electronic
Publication Info	Piscataway, NJ : IEEE.
Supplemental Content	Click here for full text
Subjects	Integrated circuits--Very large scale integration. --Design and construction. --Congresses. Integrated circuits--Very large scale integration. --Testing. --Congresses. Integrated circuits--Very large scale integration. --Congresses.

Uniform title	Proceedings of Technical Program of ... International Symposium on VLSI Design, Automation and Test (Online)
Variant title	Proceedings of Technical Program of ... International Symposium on VLSI Design, Automation & Test
Variant title	VLSI-DAT ...
Variant title	International Symposium on VLSI Design, Automation & Test
Variant title	First issue has title: IEEE VLSI-TSA International Symposium on VLSI Design, Automation & Test (VLSI-TSA-DAT)
Frequency	Annual
Access restriction	Available only to authorized users.
Other forms	Also available in print.
Technical details	Mode of access: World Wide Web.
Source of description	2006; title from PDF cover (IEEEXplore website, viewed on June 8, 2016).
Source of description	2016 (viewed on June 8, 2016).
Preceding title	International Symposium on VLSI Technology, Systems, and Applications. Proceedings of technical papers
Issued in other form	Print verison: International Symposium on VLSI Design, Automation, and Test. Proceedings of Technical Program of ... International Symposium on VLSI Design, Automation and Test 2380-7369
Genre/form	Electronic journals.
Other title	IEEE/IET Electronic Library (IEL)
LCCN	2016202348
ISSN	2472-9124 2380-7369
Stock number	IEEE, 445 Hoes Lane, Piscataway, NJ 08854-4141

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Proceedings of Technical Program of ... International Symposium on VLSI Design, Automation and Test

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