System and Bayesian reliability essays in honor of Professor Richard E. Barlow on his 70th birthday / editors, Yu Hayakawa, Telba Irony, Min Xie.

Format Electronic
Publication InfoRiver Edge, NJ : World Scientific,
Descriptionxxvii, 409 p. : ill. ; 23 cm.
Supplemental ContentFull text available from Ebook Central - Academic Complete
Subjects

Other author/creatorHayakawa, Yu.
Other author/creatorIrony, Telba.
Other author/creatorXie, M. (Min)
Other author/creatorBarlow, Richard E.
SeriesSeries on quality, reliability & engineering statistics ; v. 5
Bibliography noteIncludes bibliographical references and index.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 2002284521
ISBN9810248652

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