Scanning electron microscopy : physics of image formation and microanalysis / Ludwig Reimer.
| Author/creator | Reimer, Ludwig, 1928- |
| Format | Book |
| Edition | 2nd completely rev. and updated ed. |
| Publication Info | Berlin ; New York : Springer, ©1998. |
| Description | xiv, 527 pages : illustrations ; 24 cm. |
| Subjects |
| Series | Springer series in optical sciences ; v. 45 Springer series in optical sciences v. 45. ^A11025 |
| Bibliography note | Includes bibliographical references and index. |
| LCCN | 98026178 |
| ISBN | 3540639764 (hardcover ; alk. paper) |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Joyner | General Stacks | QH212.S3 R452 1998 | ✔ Available | Place Hold |