System for long-duration electrical testing of SiC IC generation 12 Chips at 500 ℗ʻC / Stephanie Booth, David Spry, and Philip Neudeck.
| Author/creator | Booth, Stephanie author. |
| Other author | Spry, David, author. |
| Other author | Neudeck, Philip, author. |
| Other author | NASA Glenn Research Center, sponsoring body. |
| Format | Electronic |
| Publication | Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, January 2025. |
| Description | 1 online resource (18 pages) : color illustrations |
| Supplemental Content | https://purl.fdlp.gov/GPO/gpo236881 |
| Supplemental Content | Address at time of PURL creation |
| General note | "January 2025." |
| General note | In scope of the U.S. Government Publishing Office Cataloging and Indexing Program (C&I) and Federal Depository Library Program (FDLP). |
| Bibliography note | Includes bibliographical references (page 18). |
| Source of description | Description based on online resource; title from PDF title page (NASA, viewed Feb. 3, 2025). |
| GPO item number | 0830-D (online) |
| Govt. docs number | NAS 1.15:20240012678 |