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111 2 a| VDAT (Symposium)?| UNAUTHORIZED;

210 0 a| Int. Symp. VLSI Des. Testb| (Online);

222 0 a| International Symposium on VLSI Design and Testb| (Online);

240 10 a| International Symposium on VLSI Design and Test (Online)?| UNAUTHORIZED;

245 10 a| International Symposium on VLSI Design and Testh| [electronic resource].;

246 1 a| VLSI Design and Test Symposium;

246 1 a| VDAT;

260 a| Piscataway, N.J. :b| IEEE;

310 a| Annual;

362 1 a| Began in 2005?;

506 a| Available only to authorized users.;

530 a| Also available in print.;

538 a| Mode of access: World Wide Web.;

588 a| Description based on: 18th (2014); title from proceedings home page (publisher's website viewed April 30, 2021).;

588 a| Latest issue consulted: 24th (2020) (viewed April 30, 2021).;

655 0 a| Electronic journals.=| ^A353035;

710 2 a| IEEE Xplore (Online service)=| ^A534875;

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International Symposium on VLSI Design and Test

Author/creator	VDAT (Symposium)
Other author	IEEE Xplore (Online service)
Format	Electronic
Publication Info	Piscataway, N.J. : IEEE
Supplemental Content	Click here for full text
Subjects	Integrated circuits--Very large scale integration. --Testing. --Congresses. Integrated circuits--Very large scale integration. --Design and construction. --Congresses.

Uniform title	International Symposium on VLSI Design and Test (Online)
Variant title	VLSI Design and Test Symposium
Variant title	VDAT
Frequency	Annual
Access restriction	Available only to authorized users.
Other forms	Also available in print.
Technical details	Mode of access: World Wide Web.
Source of description	Description based on: 18th (2014); title from proceedings home page (publisher's website viewed April 30, 2021).
Source of description	Latest issue consulted: 24th (2020) (viewed April 30, 2021).
Issued in other form	Print version: VDAT (Symposium). International Symposium on VLSI Design and Test 2475-8620
Genre/form	Electronic journals.
LCCN	2021202006
ISSN	2768-0800

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International Symposium on VLSI Design and Test

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