Electronics reliability and measurement technology nondestructive evaluation / edited by Joseph S. Heyman.
| Other author | Heyman, Joseph S. |
| Other author | Electronics Reliability and Measurement Technology Workshop (1986 : NASA Langley Research Center) |
| Format | Electronic |
| Publication Info | Park Ridge, N.J., U.S.A. : Noyes Data Corp., |
| Description | xii, 128 p. : ill. ; 27 cm. |
| Supplemental Content | Full text available from William Andrew Supplement: Complete 1995 - 2006 |
| Supplemental Content | Full text available from eBook - Engineering pre-2007 |
| Subjects |
| General note | "The Electronics Reliability and Measurement Technology Workshop was held in June 1986 at NASA Langley Research Center"--P. vii. |
| Bibliography note | Includes bibliographies and index. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |
| LCCN | 88025395 |
| ISBN | 081551171X : |
Availability
| Library | Location | Call Number | Status | Item Actions |
|---|---|---|---|---|
| Electronic Resources | ✔ Available |