Oberflächenbeschichtungen von Silizium, HOPG und Graphitanoden mittels Thiol-En/In Click-Chemie, deren Charakterisierung mit XPS und ToF-SIMS sowie elektrochemische Untersuchung / Moock, Dominique Stephan.
| Author/creator | Moock, Dominique Stephan |
| Format | Electronic |
| Publication Info | [S.l.] : Logos Verlag, |
| Supplemental Content | Full text available from Ebook Central - Academic Complete |
| General note | Title from content provider. |
| Access restriction | Available only to authorized users. |
| Technical details | Mode of access: World Wide Web |
| Genre/form | Electronic books. |