Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists / Dong ZhiLi.

Author/creator Dong, ZhiLi
Format Electronic
EditionFirst edition.
Publication InfoBoca Raton, FL : CRC Press, 2022.
Descriptionpages cm
Supplemental ContentFull text available from Taylor & Francis eBooks
Subjects

SeriesAdvances in materials science and engineering
Abstract "The goal of this textbook is to effectively equip readers with an in-depth understanding of crystallography, x-ray diffraction, and transmission electron microscopy theories as well as applications. Written as an introduction to the topic with minimal reliance on advanced mathematics, the book will appeal to a broad spectrum of readers, including students, engineers, and researchers in materials science and engineering, applied physics, and chemical engineering. It can be used in XRD and TEM lab training"-- Provided by publisher.
Bibliography noteIncludes bibliographical references and index.
Access restrictionAvailable only to authorized users.
Technical detailsMode of access: World Wide Web
Genre/formElectronic books.
LCCN 2021056285
ISBN9780367357948 (hbk)
ISBN9781032246802 (pbk)
ISBN(ebk)

Availability

Library Location Call Number Status Item Actions
Electronic Resources Access Content Online ✔ Available